Defect detection of printed circuit board assembly based on YOLOv5
Detection of printed circuit board assembly (PCBA) defects is crucial for improving the efficiency of PCBA manufacturing. This paper proposes PCBA-YOLO, a YOLOv5-based method that can effectively increase the accuracy of PCBA defect detection. First, the spatial pyramid pooling module with cross-stage partial structure is replaced in the neck network of YOLOv5 to capture the resolution features at multiple scales. Second, large kernel convolution is introduced in the backbone network to obtain larger effective receptive fields while reducing computational overhead. Finally, an SIoU loss function that considers the angular cost is utilized to enhance the convergence speed of the model. In addition, an assembled PCBA defect detection dataset named PCBA-DET is created in this paper, containing the corresponding defect categories and annotations of defect locations. The experimental results on the PCB defect dataset demonstrate that the improved method has lower loss values and higher accuracy. Evaluated on the PCBA-DET dataset, the mean average precision reaches 97.3 <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mo>%</mml:mo></mml:math> , achieving a real-time detection performance of 322.6 frames per second, which considers both the detection accuracy and the model size compared to the YOLO series of detection networks. The source code and PCBA-DET dataset can be accessed at https://github.com/ismh16/PCBA-Dataset .
Authors
- Minghui Shen
- Hao He (ORCID: https://orcid.org/0009-0007-4276-063X)
- Jian Liu (ORCID: https://orcid.org/0000-0002-2565-3863)
- Yan Wang (ORCID: https://orcid.org/0000-0003-3081-9554)
- Yujie Liu (ORCID: https://orcid.org/0000-0002-0751-6857)
- Qingyang Wang (ORCID: https://orcid.org/0000-0002-5729-2898)
- Jing Chen (ORCID: https://orcid.org/0009-0002-1504-7939)
- Ye Jiang (ORCID: https://orcid.org/0000-0002-6150-2253)
- Kangqi Ye
- Jie Che
- Heyuan Gao
Institutions
- University of Electronic Science and Technology of China (CN)
- Hefei University of Technology (CN)
- Chinese Academy of Sciences (CN)
- Nanjing University of Information Science and Technology (CN)
- Shandong Institute of Automation (CN)
- Anhui Institute of Information Technology (CN)
Publication Details
- Journal
- Scientific Reports
- Published
- 2024-08-20
- DOI
- https://doi.org/10.1038/s41598-024-70176-1
- Citations
- 24
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 8.37
Funders
- National Natural Science Foundation of China
- Natural Science Foundation of Anhui Province
- Fundamental Research Funds for the Central Universities