Prediction of Shockley–Read–Hall lifetimes in strained layer superlattices for mid-wave and long-wave infrared photodetectors

We have calculated carrier nonradiative recombination lifetimes limited by Shockley–Read–Hall (SRH) centers in strained layer superlattices (SLSs) for mid-wave and long-wave infrared applications. The capture rate of an electron (hole) in the SLS's conduction (valence) band by the defect level is dominated by a multi-phonon process, which is orders-of-magnitude more efficient than the radiative process. Long-range polar coupling between electrons and optical phonons can account for the observed SRH lifetimes in a variety of SLSs reported in the literature. The capture rate depends on temperature rather weakly, consistent with experimental observations. The efficient capture is caused by the comparable electronic difference and lattice relaxation energy, Ect∼Sℏω, with S and ℏω being the Huang–Rhys factor and optical photon energy in the SLSs. A weaker polar coupling would give rise to a smaller capture cross section, which, for InAs/InAsSb SLSs, can be achieved by increasing Sb in the alloy region.