A wide dynamic range front-end electronics for SiPMs using high-speed operational and integration amplifiers
Silicon photomultipliers (SiPM) have gained popularity in particle physics due to their inherent advantages in terms of compactness, low power consumption, and high photon detection efficiency. Moreover, we have to deal with signals ranging from a few photoelectrons (PE), where we need to reconstruct the exact shape, up to thousands of PEs in short time intervals. The design of this amplifier was conceived to handle the SiPMs signal in both cases, combining together a high-speed amplifier for precisely reconstruct the shape of the signals of a few PEs and an integrated one in which the output voltage level is directly proportional to the number of the input PEs.
Authors
- F. Ferraro (ORCID: https://orcid.org/0000-0002-2031-7879)
- B. Bottino (ORCID: https://orcid.org/0000-0002-3017-2167)
- A. Campani (ORCID: https://orcid.org/0000-0002-1453-5247)
- G. Sobrero
- R. Caravita (ORCID: https://orcid.org/0000-0002-8189-8814)
- G. Testera (ORCID: https://orcid.org/0000-0003-2970-766X)
- L. Di Noto (ORCID: https://orcid.org/0000-0002-2448-6805)
- A. Caminata (ORCID: https://orcid.org/0000-0002-5800-5504)
- S. Copello (ORCID: https://orcid.org/0000-0002-8273-7289)
- S. Di Domizio
- M. Pallavicini (ORCID: https://orcid.org/0000-0001-7309-3023)
- M. Cariello
- Silvia Repetto (ORCID: https://orcid.org/0000-0002-6103-9190)
- P. Musico (ORCID: https://orcid.org/0000-0002-5842-4135)
Institutions
- Istituto Nazionale di Fisica Nucleare, Laboratori Nazionali del Gran Sasso (IT)
- Istituto Nazionale di Fisica Nucleare, Trento Institute for Fundamental Physics And Applications (IT)
- Istituto Nazionale di Fisica Nucleare, Sezione di Pavia (IT)
- Istituto Nazionale di Fisica Nucleare, Sezione di Genova (IT)
- University of Genoa (IT)
Publication Details
- Journal
- Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
- Published
- 2024-08-19
- DOI
- https://doi.org/10.1016/j.nima.2024.169756
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00