3.7-GHz Multi-Bank High-Current Single-Port Cache SRAM With Leakage Saving Circuits in 3-nm FinFET for HPC Applications
Row decoder leakage saving (RDLS) and high-speed write driver leakage saving (HS-WDLS) circuits are proposed to reduce leakage power while keeping high access speed. The proposed circuits achieve a 71% reduction in leakage power. Additionally, a detailed discussion on the trade-off between switching current increase and leakage current reduction is presented. The overhead of switching power is 0.3% and 1.9% for read and write operations, respectively. Simulation results show that our static random-access memory (SRAM) has actual power reduction when active rate is lower than 21% at <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$25~^{\circ }$ </tex-math></inline-formula> C, 81% at <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$75~^{\circ }$ </tex-math></inline-formula> C, and 100% at <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$85~^{\circ }$ </tex-math></inline-formula> C or higher. Silicon measurements demonstrate that it operates at a frequency of 3.7 GHz at 1.4 V and has a wide-range operation down to 0.5 V. It achieves the best figure of merit (FoM), defined as density <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\times F_{\max }$ </tex-math></inline-formula>.
Authors
- Yoshiaki Osada (ORCID: https://orcid.org/0009-0001-2796-4243)
- Koji Nii (ORCID: https://orcid.org/0000-0002-9986-5308)
- Quincy Li
- Hidehiro Fujiwara
- Y. Aoyagi (ORCID: https://orcid.org/0009-0000-6406-1601)
- Hung-Jen Liao
- Shien-Yang Wu
- J.J. Liaw
- Takaaki Nakazato
- Tsung-Yung Jonathan Chang (ORCID: https://orcid.org/0009-0007-6505-5474)
Institutions
- Taiwan Semiconductor Manufacturing Company (Taiwan) (TW)
Publication Details
- Journal
- IEEE Journal of Solid-State Circuits
- Published
- 2024-08-19
- DOI
- https://doi.org/10.1109/jssc.2024.3440970
- Citations
- 2
- Primary Topic
- Semiconductor materials and devices
- Type
- article
- Field-Weighted Citation Impact
- 0.42