Revisiting the Epitaxial Growth Mechanism of 2D TMDC Single Crystals

Epitaxial growth of 2D transition metal dichalcogenides (TMDCs) on sapphire substrates has been recognized as a pivotal method for producing wafer-scale single-crystal films. Both step-edges and symmetry of substrate surfaces have been proposed as controlling factors. However, the underlying fundamental still remains elusive. In this work, through the molybdenum disulfide (MoS<sub>2</sub>) growth on C/M sapphire, it is demonstrated that controlling the sulfur evaporation rate is crucial for dictating the switch between atomic-edge guided epitaxy and van der Waals epitaxy. Low-concentration sulfur condition preserves O/Al-terminated step edges, fostering atomic-edge epitaxy, while high-concentration sulfur leads to S-terminated edges, preferring van der Waals epitaxy. These experiments reveal that on a 2 in. wafer, the van der Waals epitaxy mechanism achieves better control in MoS<sub>2</sub> alignment (≈99%) compared to the step edge mechanism (<85%). These findings shed light on the nuanced role of atomic-level thermodynamics in controlling nucleation modes of TMDCs, thereby providing a pathway for the precise fabrication of single-crystal 2D materials on a wafer scale.

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Publication Details

Journal
Advanced Materials
Published
2024-08-16
DOI
https://doi.org/10.1002/adma.202404923
Citations
29
Primary Topic
2D Materials and Applications
Type
article
Field-Weighted Citation Impact
3.40

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article

Revisiting the Epitaxial Growth Mechanism of 2D TMDC Single Crystals

Areej Aljarb, Yi Wan, Kaimin Shih, Fangyuan Zheng et al.
29 citations
Advanced Materials
2D Materials and Applications
3.40
article

Revisiting the Epitaxial Growth Mechanism of 2D TMDC Single Crystals

Areej Aljarb, Yi Wan, Kaimin Shih, Fangyuan Zheng, Yu‐Ming Chang, Lain‐Jong Li, Jiacheng Min, Qinze Yu, Pengfei Yang, Yuxiang Zhang, Chenyang Li, Jing‐Kai Huang, Zhengtang Luo, Yang Ni, Haomin Liu, Yu Li
article en
29 citations

Abstract

Epitaxial growth of 2D transition metal dichalcogenides (TMDCs) on sapphire substrates has been recognized as a pivotal method for producing wafer-scale single-crystal films. Both step-edges and symmetry of substrate surfaces have been proposed as controlling factors. However, the underlying fundamental still remains elusive. In this work, through the molybdenum disulfide (MoS<sub>2</sub>) growth on C/M sapphire, it is demonstrated that controlling the sulfur evaporation rate is crucial for dictating the switch between atomic-edge guided epitaxy and van der Waals epitaxy. Low-concentration sulfur condition preserves O/Al-terminated step edges, fostering atomic-edge epitaxy, while high-concentration sulfur leads to S-terminated edges, preferring van der Waals epitaxy. These experiments reveal that on a 2 in. wafer, the van der Waals epitaxy mechanism achieves better control in MoS<sub>2</sub> alignment (≈99%) compared to the step edge mechanism (<85%). These findings shed light on the nuanced role of atomic-level thermodynamics in controlling nucleation modes of TMDCs, thereby providing a pathway for the precise fabrication of single-crystal 2D materials on a wafer scale.

Advanced MaterialsVol. 36(51)
City University of Hong Kong (HK), Chinese University of Hong Kong (HK), King Abdulaziz University (SA), Hong Kong University of Science and Technology (HK), HKUST Shenzhen Research Institute (CN), King Abdullah University of Science and Technology (SA), University of Hong Kong (HK)
University Grants Committee, Natural Science Foundation of Guangdong Province, University of Hong Kong, Hong Kong Polytechnic University, University Research Committee, University of Hong Kong, Key Technologies Research and Development Program
Openalex Percentile: Top 4%
2D Materials and Applications
3.40
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