Microstructural details with directional dark-field imaging using Talbot-Lau interferometer

The Talbot-Lau grating interferometer advances x-ray imaging by enabling phase contrast, dark-field imaging, and differential phase contrast imaging with lab-based x-ray sources, alongside conventional absorption images. This study explores directional dark-field imaging (DDFI) to reveal microstructural details in samples. Using a Talbot-Lau setup, we measured materials like carbon fiber, demonstrating DDFI's effectiveness in visualizing anisotropy, orientation, and microstructure. By rotating the sample and analyzing scattering directions, we showcase DDFI's ability to describe complex material features. Our findings indicate DDFI's potential in materials science, offering new insights into sample characterization and analysis.