Hot spot localization in the field of view of the Kirkpatrick–Baez microscope

The Kirkpatrick–Baez (KB) microscope is an effective instrument for x-ray imaging of hot spot. However, the non-uniform distribution of response efficiency in the field of view is a drawback of the KB microscope. A more accurate hot spot image requires the correction of the measured image by combining the hot spot position and the response efficiency distribution. Here, we describe a method to locate the position of the hot spot in the field of view during hot spot imaging with a KB microscope. The position of the hot spot in the field of view can be obtained by measuring the grazing incidence angle change during hot spot imaging. In the experiment of hot spot self-emission imaging with a four-channel KB microscope, the location of the hot spot with an accuracy of 15 μm was realized, and the intensity corrected hot spot image was obtained. This will solve the problem of the non-uniform distribution of the response efficiency of the KB microscope and enable quantitative measurement of hot spot radiation intensity.

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Publication Details

Journal
AIP Advances
Published
2024-08-01
DOI
https://doi.org/10.1063/5.0219716
Citations
1
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
Field-Weighted Citation Impact
0.61

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Hot spot localization in the field of view of the Kirkpatrick–Baez microscope

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Hot spot localization in the field of view of the Kirkpatrick–Baez microscope

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article en
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Abstract

The Kirkpatrick–Baez (KB) microscope is an effective instrument for x-ray imaging of hot spot. However, the non-uniform distribution of response efficiency in the field of view is a drawback of the KB microscope. A more accurate hot spot image requires the correction of the measured image by combining the hot spot position and the response efficiency distribution. Here, we describe a method to locate the position of the hot spot in the field of view during hot spot imaging with a KB microscope. The position of the hot spot in the field of view can be obtained by measuring the grazing incidence angle change during hot spot imaging. In the experiment of hot spot self-emission imaging with a four-channel KB microscope, the location of the hot spot with an accuracy of 15 μm was realized, and the intensity corrected hot spot image was obtained. This will solve the problem of the non-uniform distribution of the response efficiency of the KB microscope and enable quantitative measurement of hot spot radiation intensity.

AIP AdvancesVol. 14(8)
Tongji University (CN), China Academy of Engineering Physics (CN), Tsinghua University (CN)
National Natural Science Foundation of China, National Key Research and Development Program of China
Affordable and clean energy
Openalex Percentile: Top 33%
Advanced X-ray Imaging Techniques
0.61
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