Study on High Voltage Reverse Bias (HTRB) Test Method of 6.5 kV High-Voltage IGBT Modules for Railway

In this article, a temperature stabilization method of high-temperature reverse bias (HTRB) and high-voltage high-temperature high-humidity reverse bias (HV-H3TRB) tests for 6.5 kV high-voltage power IGBT modules used in railway is proposed. The traditional climate chamber is not suitable for stabilizing the temperature of high-voltage IGBT modules, as there are multi-chips connected in parallel, which can create a high leakage current during the high-voltage blocking state at high junction temperature. The proposed junction temperature stabilization method can avoid thermal runaway caused by positive feedback between power loss and junction temperature in HTRB and HV-H3TRB tests, and the effectiveness is confirmed by experimental results. Furthermore, a precise junction temperature measurement method based on leakage current is proposed, which can be used to set initial junction temperature correctly for HTRB and HV-H3TRB tests.

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Publication Details

Journal
IEEE Transactions on Power Electronics
Published
2024-08-09
DOI
https://doi.org/10.1109/tpel.2024.3441050
Citations
6
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
1.25

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article

Study on High Voltage Reverse Bias (HTRB) Test Method of 6.5 kV High-Voltage IGBT Modules for Railway

Erping Deng, Yongzhang Huang, Yanhao Wang, Yuxing Yan et al.
6 citations
IEEE Transactions on Power Electronics
Silicon Carbide Semiconductor Technologies
1.25
article

Study on High Voltage Reverse Bias (HTRB) Test Method of 6.5 kV High-Voltage IGBT Modules for Railway

Erping Deng, Yongzhang Huang, Yanhao Wang, Yuxing Yan, Weijie Wang, Hongyu Sun, Qingtong He, Zuoyi Wang
article en
6 citations

Abstract

In this article, a temperature stabilization method of high-temperature reverse bias (HTRB) and high-voltage high-temperature high-humidity reverse bias (HV-H3TRB) tests for 6.5 kV high-voltage power IGBT modules used in railway is proposed. The traditional climate chamber is not suitable for stabilizing the temperature of high-voltage IGBT modules, as there are multi-chips connected in parallel, which can create a high leakage current during the high-voltage blocking state at high junction temperature. The proposed junction temperature stabilization method can avoid thermal runaway caused by positive feedback between power loss and junction temperature in HTRB and HV-H3TRB tests, and the effectiveness is confirmed by experimental results. Furthermore, a precise junction temperature measurement method based on leakage current is proposed, which can be used to set initial junction temperature correctly for HTRB and HV-H3TRB tests.

IEEE Transactions on Power ElectronicsVol. 39(11)
North China Electric Power University (CN), Hefei University of Technology (CN), China Academy of Railway Sciences (CN), State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources
National Natural Science Foundation of China
Openalex Percentile: Top 20%
Silicon Carbide Semiconductor Technologies
1.25
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