A multi-scale attention mechanism for detecting defects in leather fabrics
Defect detection is critical to industrial quality control in leather production engineering. The various sizes and locations of defects in leather, as well as significant differences within the same class and indistinctive variations between different classes of defects, contribute to the complexity of the problem. To address this challenge, we propose a Multi-Layer Residual Convolutional Attention (MLRCA) approach. MLRCA enhances its ability to capture both intra-class and inter-class differences by enhancing the semantic feature representation in the backbone network. To improve multiscale fusion effects, we also incorporate the MLRCA module into the feature pyramid network (FPN) and propose a new multi-layer residual convolution attention feature pyramid network (ML-FPN). This approach enables more accurate identification of leather defects at a more detailed level by selectively capturing contextual information from different domains. We then implement the Side-Aware Boundary Localization (SABL) detection head, which accurately locates defects and helps the network distinguish between similar defect categories for more precise positioning. To validate the effectiveness of our approach, we conducted ablation experiments on the created leather dataset. Comparative experiments demonstrate the excellent capability of our model to detect minor defects. The model achieved 83.4, 89.7, and 85.6 for the AP, AP<sub>50</sub>, and AP<sub>75</sub> evaluation metrics. In addition, the model achieves 71.3, 89.9, and 88.9 for AP<sub>S</sub>, AP<sub>M</sub>, and AP<sub>L</sub>. Our approach has been confirmed feasible through experimentation and provides new insights for automated leather defect detection methods.
Authors
- Yuchen Zhao (ORCID: https://orcid.org/0000-0002-9779-4577)
- Xiao Ou (ORCID: https://orcid.org/0000-0002-3385-9781)
- Hao Li
- Huawei Xu (ORCID: https://orcid.org/0000-0003-4648-2554)
- Mengzhen Huang (ORCID: https://orcid.org/0000-0002-1032-555X)
- Tongzhen Xing (ORCID: https://orcid.org/0000-0001-7597-8298)
- Zhen Kang (ORCID: https://orcid.org/0000-0003-2819-4743)
- Yifan Liu (ORCID: https://orcid.org/0009-0003-8750-7882)
- Ke Yang (ORCID: https://orcid.org/0009-0009-2159-4980)
Institutions
- Wuhan Polytechnic University (CN)
- Jiaxing University (CN)
- Tsinghua University (CN)
Publication Details
- Journal
- Heliyon
- Published
- 2024-08-01
- DOI
- https://doi.org/10.1016/j.heliyon.2024.e35957
- Citations
- 4
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 1.40
Funders
- Jiangsu Provincial Key Laboratory of New Environmental Protection
- Wuhan Polytechnic University
- National Aerospace Science Foundation of China
- Key Research and Development Program of Hunan Province of China
- Science and Technology Program of Hubei Province