Application of Square-Wave Stripping Voltammetry for the Analysis of Lead–Bismuth Electrodeposits

The possibility of targeted electrodeposition of metal coatings in the lead–bismuth binary system is considered. The analysis of metal content in the deposits is performed using square-wave stripping voltammetry of solutions containing both lead and bismuth. The results are supported by the data of scanning electron microscopy, energy-dispersive X-ray spectroscopy, and X-ray diffraction analysis. The conditions for the formation of Pb7Bi3 (ε-phase), which is promising for the application in superconducting microelectronics, are found.

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Publication Details

Journal
Russian Journal of Electrochemistry
Published
2024-08-01
DOI
https://doi.org/10.1134/s1023193524700198
Citations
2
Primary Topic
Surface and Thin Film Phenomena
Type
article
Field-Weighted Citation Impact
0.68
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article

Application of Square-Wave Stripping Voltammetry for the Analysis of Lead–Bismuth Electrodeposits

I. V. Kolesnik, Kirill S. Napolskii, Stepan V. Sotnichuk, I Voronin
2 citations
Russian Journal of Electrochemistry
Surface and Thin Film Phenomena
0.68
article

Application of Square-Wave Stripping Voltammetry for the Analysis of Lead–Bismuth Electrodeposits

I. V. Kolesnik, Kirill S. Napolskii, Stepan V. Sotnichuk, I Voronin
article en
2 citations

Abstract

The possibility of targeted electrodeposition of metal coatings in the lead–bismuth binary system is considered. The analysis of metal content in the deposits is performed using square-wave stripping voltammetry of solutions containing both lead and bismuth. The results are supported by the data of scanning electron microscopy, energy-dispersive X-ray spectroscopy, and X-ray diffraction analysis. The conditions for the formation of Pb7Bi3 (ε-phase), which is promising for the application in superconducting microelectronics, are found.

Russian Journal of ElectrochemistryVol. 60(8)
Lomonosov Moscow State University (RU), NS Kurnakova Institute of General and Inorganic Chemistry (RU)
Openalex Percentile: Top 32%
Surface and Thin Film Phenomena
0.68
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