TAN calibration algorithm based on wave parameters

With the development of microwave test technology, higher test accuracy of microwave devices is required. The calibration results of the existing TAN calibration algorithm are not accurate enough because the non-source port does not reach the ideal match. In this paper, a new TAN calibration algorithm based on wave quantity is studied to eliminate the error introduced by direct acquisition of non-ideal S-parameters. Compared with the classical S-parameter calibration algorithm, the proposed algorithm has the same calibration effect and smoother trace, which improves the test accuracy of the device.