The Impact of Allocating Weights and Biases in SRAM Parity Checking Areas on the Soft Error Reliability of CNN Inference Models

This paper promotes a novel semi-automated compiler-based technique that allocates CNN weights and bias to SRAM parity checking areas. Radiation results suggest that it is possible to reduce critical SDC events by up to 90%.

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Published
2024-09-16
DOI
https://doi.org/10.1109/radecs61970.2024.11298584
Primary Topic
Radiation Effects in Electronics
Type
article
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article

The Impact of Allocating Weights and Biases in SRAM Parity Checking Areas on the Soft Error Reliability of CNN Inference Models

Rodrigo Possamai Bastos, Jonas Gava, Luiz Henrique Laurini
Radiation Effects in Electronics
article

The Impact of Allocating Weights and Biases in SRAM Parity Checking Areas on the Soft Error Reliability of CNN Inference Models

Rodrigo Possamai Bastos, Jonas Gava, Luiz Henrique Laurini
article en

Abstract

This paper promotes a novel semi-automated compiler-based technique that allocates CNN weights and bias to SRAM parity checking areas. Radiation results suggest that it is possible to reduce critical SDC events by up to 90%.

Institut polytechnique de Grenoble (FR), Centre National de la Recherche Scientifique (FR), Universidade Federal do Rio Grande do Sul (BR), Loughborough University (GB), Techniques of Informatics and Microelectronics for Integrated Systems Architecture (FR), Pontifícia Universidade Católica do Rio Grande do Sul (BR), Université Grenoble Alpes (FR)
Openalex Percentile: Top 94%
Radiation Effects in Electronics
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