Revealing the Latent Atomic World Through Data-Driven Microscopy
Many emerging technologies depend on the precise design of materials structure, chemistry, and defects. As devices shrink, manufacturing tolerances tighten, and performance envelopes improve, we must increasingly measure and manipulate materials at or near the single atom level. Here we describe how transmission electron microscopy (TEM) underpins our ability to see and direct the latent atomic world. We review a selection of our recent high-resolution TEM studies of the synthesis of oxide-based nanomaterials and their evolution in extreme environments. We then discuss powerful new artificial intelligence (AI) and machine learning (ML) approaches we have developed for rich, reproducible, and scalable experimentation. Furthermore, we conclude by discussing future developments that will enable new materials for breakthrough technologies.
Authors
- Steven R. Spurgeon (ORCID: https://orcid.org/0000-0003-1218-839X)
Institutions
- Pacific Northwest National Laboratory (US)
- University of Washington (US)
Publication Details
- Journal
- OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
- Published
- 2024-10-31
- Primary Topic
- Advanced Materials Characterization Techniques
- Type
- article
Funders
- U.S. Department of Energy
- Battelle
- Basic Energy Sciences
- Biological and Environmental Research
- Laboratory Directed Research and Development
- Pacific Northwest National Laboratory