On-Orbit ELDRS Instrument: BJTs on NASA Space Environment Testbed
Flight data on bipolar junction transistors (BJTs) are recorded to characterize the effect of low dose rate (LDR) space irradiation; results are comparable to ground-based LDR and elevated temperature tests. Additionally, Gummel plots of mission data are compared for different device under test (DUT) experiment variables.
Authors
- Michael J. Campola (ORCID: https://orcid.org/0000-0002-6781-6528)
- Cheyenne Cook
- Anna Tender
- A. R. Benedetto
- Hugh Barnaby (ORCID: https://orcid.org/0000-0002-8136-1849)
Institutions
- Yale University (US)
- National Aeronautics and Space Administration (US)
- Arizona State University (US)
Publication Details
- Journal
- Digital Commons - USU (Utah State University)
- Published
- 2025-08-21
- DOI
- https://doi.org/10.26077/mq51-y136
- Primary Topic
- Atomic and Subatomic Physics Research
- Type
- article